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Automatic reconstruction of irregular shape defects in pulsed thermography using deep learning neural network
Liu, Haochen
;
Li, Wenhan
;
Yang, Lichao
;
Deng, Kailun
;
Zhao, Yifan
(
Springer
,
2022-07-25
)
A novel inspection technique for electronic components using thermography (NITECT)
Liu, Haochen
;
Tinsley, Lawrence
;
Lam, Wayne
;
Addepalli, Sri
;
Liu, Xiaochen
;
Starr, Andrew
;
Zhao, Yifan
(
MDPI
,
2020-09-03
)
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Author
Liu, Haochen (2)
Zhao, Yifan (2)
Addepalli, Sri (1)
Deng, Kailun (1)
Lam, Wayne (1)
Li, Wenhan (1)
Liu, Xiaochen (1)
Starr, Andrew (1)
Tinsley, Lawrence (1)
Yang, Lichao (1)
Subject
pulsed thermography (2)
deep learning (1)
defect reconstruction (1)
feature selection (1)
finite element modeling (1)
numerical simulation (1)
quantitative classification (1)
unverified electronic components (1)
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Date Issued
2022 (1)
2020 (1)