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Automatic reconstruction of irregular shape defects in pulsed thermography using deep learning neural network
Liu, Haochen
;
Li, Wenhan
;
Yang, Lichao
;
Deng, Kailun
;
Zhao, Yifan
(
Springer
,
2022-07-25
)
A novel inspection technique for electronic components using thermography (NITECT)
Liu, Haochen
;
Tinsley, Lawrence
;
Lam, Wayne
;
Addepalli, Sri
;
Liu, Xiaochen
;
Starr, Andrew
;
Zhao, Yifan
(
MDPI
,
2020-09-03
)
Quantifying uncertainty in pulsed thermographic inspection by analysing the thermal diffusivity measurements of metals and composites
Addepalli, Sri
;
Zhao, Yifan
;
Erkoyuncu, John Ahmet
;
Roy, Rajkumar
(
MDPI
,
2021-08-14
)
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Author
Zhao, Yifan (3)
Addepalli, Sri (2)
Liu, Haochen (2)
Deng, Kailun (1)
Erkoyuncu, John Ahmet (1)
Lam, Wayne (1)
Li, Wenhan (1)
Liu, Xiaochen (1)
Roy, Rajkumar (1)
Starr, Andrew (1)
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Subject
pulsed thermography (3)
deep learning (1)
defect reconstruction (1)
feature selection (1)
finite element modeling (1)
numerical simulation (1)
quantitative classification (1)
thermal diffusivity (1)
uncertainty quantification (1)
unverified electronic components (1)
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Date Issued
2022 (1)
2021 (1)
2020 (1)