Characterisation and measurement to the sub-micron scale of a reference wire position

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dc.contributor.authorSanz, Claude
dc.contributor.authorCherif, Ahmed
dc.contributor.authorMainaud-Durand, Hélène
dc.contributor.authorMorantz, Paul
dc.contributor.authorShore, Paul
dc.date.accessioned2017-09-22T11:20:22Z
dc.date.available2017-09-22T11:20:22Z
dc.date.issued2015-09-21
dc.identifier.citationSanz C, Cherif A, Mainaud Durand H, Morantz P, Shore P, Characterisation and measurement to the sub-micron scale of a reference wire position, Proceedings of 17th International Congress of Metrology, 21-24 September 2015, Paris, France, Article number 13005en_UK
dc.identifier.urihttp://dx.doi.org/10.1051/metrology/20150013005
dc.identifier.urihttps://dspace.lib.cranfield.ac.uk/handle/1826/12538
dc.language.isoenen_UK
dc.publisherEDP Sciencesen_UK
dc.rightsAttribution 4.0 International (CC BY 4.0) You are free to: Share — copy and redistribute the material in any medium or format Adapt — remix, transform, and build upon the material for any purpose, even commercially. The licensor cannot revoke these freedoms as long as you follow the license terms. Under the following terms: Attribution — You must give appropriate credit, provide a link to the license, and indicate if changes were made. You may do so in any reasonable manner, but not in any way that suggests the licensor endorses you or your use. Information: No additional restrictions — You may not apply legal terms or technological measures that legally restrict others from doing anything the license permits.
dc.titleCharacterisation and measurement to the sub-micron scale of a reference wire positionen_UK
dc.typeConference paperen_UK

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