Characterisation and measurement to the sub-micron scale of a reference wire position
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2015-09-21
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EDP Sciences
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Conference paper
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Citation
Sanz C, Cherif A, Mainaud Durand H, Morantz P, Shore P, Characterisation and measurement to the sub-micron scale of a reference wire position, Proceedings of 17th International Congress of Metrology, 21-24 September 2015, Paris, France, Article number 13005
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