Large Energy Storage Density and High Thermal Stability in a Highly Textured (111)-Oriented Pb0.8Ba0.2ZrO3 Relaxor Thin Film with the Coexistence of Antiferroelectric and Ferroelectric Phases

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Large_energy-storage_density_2015.pdf (1.52 MB)

Date published

2015-05-21

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Authors

Peng, Biaolin
Zhang, Qi
Li, Xing
Sun, Tieyu
Fan, Huiqing
Ke, Shanming
Ye, Mao
Wang, Yu
Lu, Wei
Niu, Hanben
Zeng, Xierong
Huang, Haitao

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Volume Title

Publisher

American Chemical Society

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Article

ISSN

1944-8244

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URI

http://dx.doi.org/10.1021/acsami.5b02790
 https://dspace.lib.cranfield.ac.uk/handle/1826/10073

Citation

Peng B, Zhang Q, Li X, et al., (2015) Large Energy Storage Density and High Thermal Stability in a Highly Textured (111)-Oriented Pb0.8Ba0.2ZrO3 Relaxor Thin Film with the Coexistence of Antiferroelectric and Ferroelectric Phases, ACS Applied Materials and Interfaces, Volume 7, Issue 24, June 2015, pp.13512-13517

Abstract

A highly textured (111)-oriented Pb0.8Ba0.2ZrO3 (PBZ) relaxor thin film with the coexistence of antiferroelectric (AFE) and ferroelectric (FE) phases was prepared on a Pt/TiOx/SiO2/Si(100) substrate by using a sol-gel method. A large recoverable energy storage density of 40.18 J/cm3 along with an efficiency of 64.1% was achieved at room temperature. Over a wide temperature range of 250 K (from room temperature to 523 K), the variation of the energy density is within 5%, indicating a high thermal stability. The high energy storage performance was endowed by a large dielectric breakdown strength, great relaxor dispersion, highly textured orientation, and the coexistence of FE and AFE phases. The PBZ thin film is believed to be an attractive material for applications in energy storage systems over a wide temperature range (Graph Presented).

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Keywords

Energy storage, Relaxor, Antiferroelectric, Textured, Sol-gel

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“NOTICE: this is the author’s version of a work that was accepted for publication in ACS Applied Materials and Interfaces. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in ACS Applied Materials and Interfaces, VOL 7, ISSUE 24, 21/05/2015 DOI 10.1021/acsami.5b02790”

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