Pardo, L.; Jiménez, R.; García, A.; Brebøl, K.; Leighton, Glenn J. T.; Huang, Zhaorong
(Maney Publishing, 2010-03-31)
Most of those techniques used for the measurement of elastic coefficients for
bulk piezoelectric ceramics are not applicable to films deposited on thick
substrates because the measured properties, such as the resonant ...