Stoyanov, S.; Bailey, C.; Tang, Y. K.; Marson, Silvia; Dyer, A.; Allen, David M.; Desmulliez, M.
(Institute of Physics (IoP), 2010-12-07)
Focused Ion Beam (FIB) and Nano-Imprint Forming (NIF) have gained recently major
interest because of their potential to enable the fabrication of precision
engineering parts and to deliver high resolution, low-cost and ...