Prokopiou, DanaeMcGovern, JamesDavies, GarethGodber, SimonEvans, PaulDicken, AnthonyRogers, Keith2020-12-092020-12-092020-07-24Prokopiou D, McGovern J, Davies G, et al., (2020) A new parafocusing paradigm for X-ray diffraction, Journal of Applied Crystallography, Volume 53, Issue 4, August 2020, pp.1073-10790021-8898https://doi.org/10.1107/S1600576720008651http://dspace.lib.cranfield.ac.uk/handle/1826/16068A new approach to parafocusing X-ray diffraction implemented with an annular incident beam is demonstrated for the first time. The method exploits an elliptical specimen path on a flat sample to produce relatively high intensity maxima that can be measured with a point detector. It is shown that the flat-specimen approximation tolerated by conventional Bragg–Brentano geometries is not required. A theoretical framework, simulations and experimental results for both angular- and energy-dispersive measurement modes are presented and the scattering signatures compared with data obtained with a conventional pencil-beam arrangement.enAttribution 4.0 Internationalfocal construct geometrypowder X-ray diffractionBragg–Brentano geometryconical incident beamsArticle