Computationally efficient, real-time, and embeddable prognostic techniques for power electronics

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dc.contributor.authorAlghassi, Alireza
dc.contributor.authorPerinpanayagam, Suresh
dc.contributor.authorSamie, Mohammad
dc.date.accessioned2019-12-17T16:24:17Z
dc.date.available2019-12-17T16:24:17Z
dc.date.issued2014-10-02
dc.description.abstractPower electronics are increasingly important in new generation vehicles as critical safety mechanical subsystems are being replaced with more electronic components. Hence, it is vital that the health of these power electronic components is monitored for safety and reliability on a platform. The aim of this paper is to develop a prognostic approach for predicting the remaining useful life of power electronic components. The developed algorithms must also be embeddable and computationally efficient to support on-board real-time decision making. Current state-of-the-art prognostic algorithms, notably those based on Markov models, are computationally intensive and not applicable to real-time embedded applications. In this paper, an isolated-gate bipolar transistor (IGBT) is used as a case study for prognostic development. The proposed approach is developed by analyzing failure mechanisms and statistics of IGBT degradation data obtained from an accelerated aging experiment. The approach explores various probability distributions for modeling discrete degradation profiles of the IGBT component. This allows the stochastic degradation model to be efficiently simulated, in this particular example ~1000 times more efficiently than Markov approaches.en_UK
dc.identifier.citationAlghassi A, Perinpanayagam S, Samie M, Sreenuch T. (2015) Computationally efficient, real-time, and embeddable prognostic techniques for power electronics. IEEE Transactions on Power Electronics, Volume 30, Issue 5, May 2015, pp. 2623-2634en_UK
dc.identifier.cris5498137
dc.identifier.issn0885-8993
dc.identifier.urihttps://doi.org/10.1109/TPEL.2014.2360662
dc.identifier.urihttps://dspace.lib.cranfield.ac.uk/handle/1826/14857
dc.language.isoenen_UK
dc.publisherIEEEen_UK
dc.rightsAttribution-NonCommercial 4.0 International*
dc.rights.urihttp://creativecommons.org/licenses/by-nc/4.0/*
dc.subjectIsolated-gate bipolar transistor (IGBT)en_UK
dc.subjectMonte-Carlo simulation (MCS)en_UK
dc.subjectpower electronicsen_UK
dc.subjectprognosticsen_UK
dc.subjectremaining useful life (RUL)en_UK
dc.titleComputationally efficient, real-time, and embeddable prognostic techniques for power electronicsen_UK
dc.typeArticleen_UK

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