High energy transmission annular beam X-ray diffraction

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dc.contributor.authorDicken, Anthony
dc.contributor.authorShevchuk, Alex
dc.contributor.authorRogers, Keith
dc.contributor.authorGodber, Simon
dc.contributor.authorEvans, Paul
dc.date.accessioned2019-12-16T12:16:47Z
dc.date.available2019-12-16T12:16:47Z
dc.date.issued2015-02-02
dc.description.abstractWe demonstrate material phase retrieval by linearly translating extended polycrystalline samples along the symmetry axis of an annular beam of high-energy X-rays. A series of pseudo-monochromatic diffraction images are recorded from the dark region encompassed by the beam. We measure Bragg maxima from different annular gauge volumes in the form of bright spots in the X-ray diffraction intensity. We present the experiment data from three materials with different crystallographic structural properties i.e. near ideal, large grain size and preferred orientation. This technique shows great promise for analytical inspection tasks requiring highly penetrating radiation such as security screening, medicine and nondestructive testing.en_UK
dc.identifier.citationDicken A, Shevchuk A, Rogers K, et al., High energy transmission annular beam X-ray diffraction. Optics Express, Volume 23, Issue 5, 2015, pp. 6304-6312en_UK
dc.identifier.cris4783423
dc.identifier.issn1094-4087
dc.identifier.urihttps://doi.org/10.1364/OE.23.006304
dc.identifier.urihttp://dspace.lib.cranfield.ac.uk/handle/1826/14840
dc.language.isoenen_UK
dc.publisherOptical Society of Americaen_UK
dc.rightsAttribution 4.0 International*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/*
dc.subjectDiffractionen_UK
dc.subjectX-ray opticsen_UK
dc.subjectScattering measurementsen_UK
dc.subjectX-ray imagingen_UK
dc.titleHigh energy transmission annular beam X-ray diffractionen_UK
dc.typeArticle

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