Growth and high frequency characterization of Mn doped sol-gel Pb xSr1-xTiO3 for frequency agile applications

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dc.contributor.authorFragkiadakis, Charalampos
dc.contributor.authorLuker, Arne
dc.contributor.authorWright, Robert V.
dc.contributor.authorFloyd, L.
dc.contributor.authorKirby, Paul B.
dc.date.accessioned2010-05-06T09:18:58Z
dc.date.available2010-05-06T09:18:58Z
dc.date.issued2009-06
dc.description.abstractIn pursuit of thin film ferroelectric materials for frequency agile applications that are both easily adapted to large area deposition and also high performance, an investigation has been carried out into sol-gel deposition of 3% Mn doped (Pb0.4Sr0.6)TiO3. Large area capability has been demonstrated by growth of films with good crystallinity and grain structure on 4 in. Si wafers. Metal-insulator-metal capacitors have also been fabricated and development of an improved de-embedding technique that takes parasitic impedances fully into account has enabled accurate extraction of the high frequency dielectric properties of the PbxSr1−xTiO3 films. Practically useful values of ε ∼ 1000, tan δ ∼ 0.03, and tunability ∼ 50% have been obtained in the low gigahertz range (1–5 GHz). Peaks in the dielectric loss due to acoustic resonance have been modeled and tentatively identified as due to an electrostrictive effect with an electromechanical coupling coefficient of ∼ 0.04 at an electric field of 240 kV/cm which is potentially useful for tunable thin film bulk acoustic wave devices.en_UK
dc.identifier.citationC. Fragkiadakis, A. Luker, R. V. Wright, L. Floyd, and P. B. Kirby, Growth and high frequency characterization of Mn doped sol-gel Pb xSr1-xTiO3 for frequency agile applications, Journal of Applied Physics, 2009, Volume 105, Issue 6, Pages 0616351-06163517, Selected papers from the 20th International Symposium on Integrated Ferroelectrics, Biopolis, Singapore, June 2008en_UK
dc.identifier.issn0021-8979
dc.identifier.urihttp://dx.doi.org/10.1063/1.3078767
dc.identifier.urihttp://hdl.handle.net/1826/4407
dc.language.isoenen_UK
dc.publisherAmerican Institute of Physicsen_UK
dc.rightsCopyright 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in C. Fragkiadakis, A. Luker, R. V. Wright, L. Floyd, and P. B. Kirby, Growth and high frequency characterization of Mn doped sol-gel Pb xSr1-xTiO3 for frequency agile applications, Journal of Applied Physics, 2009, Volume 105, Issue 6, Pages 0616351-06163517, Selected papers from the 20th International Symposium on Integrated Ferroelectrics, Biopolis, Singapore, June 2008 and may be found at http://dx.doi.org/10.1063/1.3078767.
dc.titleGrowth and high frequency characterization of Mn doped sol-gel Pb xSr1-xTiO3 for frequency agile applicationsen_UK
dc.typeArticleen_UK

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