A novel defect depth measurement method based on nonlinear system identification for pulsed thermographic inspection

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dc.contributor.authorZhao, Yifan
dc.contributor.authorMehnen, Jorn
dc.contributor.authorSirikham, Adisorn
dc.contributor.authorRoy, Rajkumar
dc.date.accessioned2016-08-31T09:26:35Z
dc.date.available2016-08-31T09:26:35Z
dc.date.issued2016-08-30
dc.description.abstractThis paper introduces a new method to improve the reliability and confidence level of defect depth measurement based on pulsed thermographic inspection by addressing the over-fitting problem. Different with existing methods using a fixed model structure for all pixels, the proposed method adaptively detects the optimal model structure for each pixel thus targeting to achieve better model fitting while using less model terms. Results from numerical simulations and real experiments suggest that (a) the new method is able to measure defect depth more accurately without a pre-set model structure (error is usually within 1% when SNR>32 dB) in comparison with existing methods, (b) the number of model terms should be 8 for signals with SNR∈View the MathML source 8–10 for SNR>40 dB and 5–8 for SNR<30 dB, and (c) a data length with at least 100 data points and 2–3 times of the characteristic time usually produces the best results.en_UK
dc.identifier.citationYifan Zhao, Jörn Mehnen, Adisorn Sirikham, Rajkumar Roy, A novel defect depth measurement method based on Nonlinear System Identification for pulsed thermographic inspection, Mechanical Systems and Signal Processing, Volume 85, 15 February 2017, Pages 382-395en_UK
dc.identifier.cris15100458
dc.identifier.issn0888-3270
dc.identifier.urihttp://dx.doi.org/10.1016/j.ymssp.2016.08.033
dc.identifier.urihttps://dspace.lib.cranfield.ac.uk/handle/1826/10466
dc.language.isoenen_UK
dc.publisherElsevieren_UK
dc.rightsAttribution 4.0 International
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/
dc.subjectNDTen_UK
dc.subjectThermographyen_UK
dc.subjectDegradation assessmenten_UK
dc.subjectSHMen_UK
dc.subjectNonlinearityen_UK
dc.subjectUncertaintyen_UK
dc.titleA novel defect depth measurement method based on nonlinear system identification for pulsed thermographic inspectionen_UK
dc.typeArticleen_UK

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