In situ observation of the evolution of porous silicon interference filter characteristics.

dc.contributor.authorVolk, J.en_UK
dc.contributor.authorFerencz, K.en_UK
dc.contributor.authorRamsden, Jeremy J.en_UK
dc.contributor.authorTóth, A. L.en_UK
dc.contributor.authorBársony, I.en_UK
dc.date.accessioned2006-01-26T12:21:15Z
dc.date.available2006-01-26T12:21:15Z
dc.date.issued2005-06en_UK
dc.description.abstractPorous silicon multilayer formation was observed by in situ monitoring of the reflectivity spectra in the visible range. In order to reproduce the formation process optical model simulation was carried out. For demonstration of this method a 24-layer microcavity structure was selected. Although in this low wavelengths region some absorption and scattering effects complicate the overall picture, the combined analysis throws new light upon the evolution of the porous silicon multilayer.en_UK
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dc.identifier.citationJ. Volk, K. Ferencz, J. J. Ramsden, A. L. Tóth, I. Bársony. In situ observation of the evolution of porous silicon interference filter characteristics. Physica Status Solidi (A), Volume 202, Issue 8, Date: June 2005, Pages: 1703-1706en_UK
dc.identifier.urihttp://hdl.handle.net/1826/977
dc.language.isoenen_UK
dc.publisherWiley-VCH Verlag GmbH & Co. KGaAen_UK
dc.rightsThis is a preprint of an article published in Physica Status Solidi (A), Volume 202, Issue 8, Date: June 2005, Pages: 1703-1706, and located at the following Wiley URL: http://www.interscience.wiley.com/. The Contributor agrees not to update the preprint or replace it with the published version of the Contribution.
dc.titleIn situ observation of the evolution of porous silicon interference filter characteristics.en_UK
dc.typeArticleen_UK

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