Investigation of contact edge effects in the channel of planar Gunn diodes

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dc.contributor.authorMindil, Ahmed
dc.contributor.authorDunn, G. M.
dc.contributor.authorKhalid, Ata
dc.contributor.authorOxley, C. H.
dc.date.accessioned2020-01-08T15:53:58Z
dc.date.available2020-01-08T15:53:58Z
dc.date.issued2019-11-26
dc.description.abstractThe effect of the edge of the channel on the operation of Planar Gunn diodes has been examined using Monte Carlo simulations. High fields at the corner of the anode contact are known to cause impact ionization and consequent electroluminescence, but our simulations show that the Gunn domains are attracted to these corners, perturbing the formation of the domains which can lead to chaotic dynamics within the rest of the channel leading to uneven heating and reduced RF output power. We show how novel shaping of the electrical contacts at the ends of the channel reduces the attraction and restores the domain wave-fronts for good device operation.en_UK
dc.identifier.citationMindil A, Dunn GM, Khalid A, Oxley CH. (2020) Investigation of contact edge effects in the channel of planar Gunn diodes. IEEE Transactions on Electron Devices, Volume 67, Issue 1, January 2020, pp. 53-56.en_UK
dc.identifier.cris25102840
dc.identifier.issn0018-9383
dc.identifier.urihttps://doi.org/10.1109/TED.2019.2951301
dc.identifier.urihttp://dspace.lib.cranfield.ac.uk/handle/1826/14895
dc.language.isoenen_UK
dc.publisherIEEEen_UK
dc.rightsAttribution-NonCommercial 4.0 International*
dc.rights.urihttp://creativecommons.org/licenses/by-nc/4.0/*
dc.subjectPlanar Gunn diodeen_UK
dc.subjectMonte Carloen_UK
dc.subjectGaAsen_UK
dc.subjectChannel Edgeen_UK
dc.titleInvestigation of contact edge effects in the channel of planar Gunn diodesen_UK
dc.typeArticleen_UK

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