Impact of crystallisation processes on depth profile formation in sol-gel PbZr0·52Ti0·48O3 thin films

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dc.contributor.authorAulika, I.-
dc.contributor.authorMergen, S.-
dc.contributor.authorBencan, A.-
dc.contributor.authorZhang, Qi-
dc.contributor.authorDejneka, A.-
dc.contributor.authorKosec, M.-
dc.contributor.authorKundzins, K.-
dc.contributor.authorDemarchi, D.-
dc.contributor.authorCivera, P.-
dc.date.accessioned2014-09-25T04:01:03Z
dc.date.available2014-09-25T04:01:03Z
dc.date.issued2013-01-31T00:00:00Z-
dc.description.abstractThis study revealed the influence of crystallisation processes on the homogeneity of the sol-gel PbZr0·52Ti 0·48O3 thin films, allowing identification and further optimisation of thin film performance. Crystallisation processes determine the optical gradient appearance, irrespective of the chemical solvents used in this work. X-ray diffraction analysis showed that a refractive index gradient was apparent in the samples which had dominant (001)/(100) orientation and significant change of lattice parameters with thickness.en_UK
dc.identifier.citationI. Aulika, S. Mergen, A. Bencan,Q. Zhang, A. Dejneka, M. Kosec. Impact of crystallisation processes on depth profile formation in sol-gel PbZr0·52Ti0·48O3 thin films. Advances in Applied Ceramics, Volume 112, Issue 1 (January 2013), pp. 53-58.
dc.identifier.issn1743-6753-
dc.identifier.urihttp://dx.doi.org/10.1179/1743676112Y.0000000019-
dc.identifier.urihttp://dspace.lib.cranfield.ac.uk/handle/1826/8701
dc.language.isoen_UK-
dc.publisherManey Publishingen_UK
dc.titleImpact of crystallisation processes on depth profile formation in sol-gel PbZr0·52Ti0·48O3 thin filmsen_UK
dc.typeArticle-

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