Advances in test and measurement of the interface adhesion and bond strengths in coating-substrate systems, emphasising blister and bulk techniques
dc.contributor.author | Chen, Xiaomei | |
dc.contributor.author | Shaw, Christopher | |
dc.contributor.author | Gelman, Len | |
dc.contributor.author | Grattan, Kenneth T. V. | |
dc.date.accessioned | 2019-07-22T15:12:50Z | |
dc.date.available | 2019-07-22T15:12:50Z | |
dc.date.issued | 2019-03-11 | |
dc.description.abstract | In this paper, recent advances in the minimum-destructive testing of the adhesion of coating-substrate systems are reviewed, focusing on key techniques such as micro- and nano-scale levels of indentation, scratching, laser-induced wave shock, as well as the blister and buckle approach. Along with adhesion failure tests, the latest and most extensive applications of the adhesion test methods in nano-, micro- and bulk-coating technology and the associated techniques to determine the minimum damage defects left on the coatings are discussed and their use reviewed. | en_UK |
dc.identifier.citation | Chen X, Shaw C, Gelman L, Grattan KTV. Advances in test and measurement of the interface adhesion and bond strengths in coating-substrate systems, emphasising blister and bulk techniques. Measurement, Volume 139, June 2019, pp. 387-402 | en_UK |
dc.identifier.issn | 0263-2241 | |
dc.identifier.uri | https://doi.org/10.1016/j.measurement.2019.03.026 | |
dc.identifier.uri | https://dspace.lib.cranfield.ac.uk/handle/1826/14371 | |
dc.language.iso | en | en_UK |
dc.publisher | Elsevier | en_UK |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 International | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | * |
dc.subject | Interface adhesion | en_UK |
dc.subject | Bond strength | en_UK |
dc.subject | Coating-substrate system | en_UK |
dc.subject | Minimum-destructive testing | en_UK |
dc.title | Advances in test and measurement of the interface adhesion and bond strengths in coating-substrate systems, emphasising blister and bulk techniques | en_UK |
dc.type | Article | en_UK |
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