Pyroelectric effect enhancement through product property under open circuit condition

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dc.contributor.authorChang, Harrison Hoon Seok
dc.contributor.authorHuang, Zhaorong
dc.date.accessioned2010-05-06T09:17:10Z
dc.date.available2010-05-06T09:17:10Z
dc.date.issued2009-07
dc.description.abstractAn analytical model for the pyroelectric (PY) effect under open circuit condition and 2-2 connectivity laminates of various pairs of PY and nonpyroelectric (NP)/elastic materials has been developed. It is evident from our analysis that there indeed is a substantial dissimilarity between the PY coefficients and figure of merit for efficiency for various PY-NP pairs under short circuit and open circuit conditions. We believe this implies that there should be a greater distinction made between the PY coefficients under these two electrical conditions than previously thought. The indicators for various PY-NP material pairs that can be utilized to determine their PY coefficient enhancement potential under open circuit condition have been identified. The investigated PY materials are lead zirconate titanate (PZT-5H and PZT-5A), barium titanate, lithium tantalate, lithium niobate, and polyvinylidene fluoride (PVDF), while the NP materials are stainless steel, polytetrafluoroethylene (PTFE or Teflon), chlorinated polyvinyl chloride thermoplastic (CPVC), aluminum, zinc, and Invar 36. Extraordinarily large PY coefficient of 97×10-4 C m-2 K-1 at minimum thickness ratio Rmin is expected for PZT-5H-CPVC pair while PVDF-CPVC could show increase in the secondary PY coefficient of up to 350%. In addition, where the figure of merit for efficiency is concerned, for the same volume of the composite PZT-5A-PTFE pair it reaches 24, a 24-fold increase in efficiency at Rmin. Our analysis techniques should provide a methodological way for appraising the potentials of particular PY material and its 2-2 laminates for applications under open circuit condition such as PY X-ray generation, electron accelerator, and nuclear fusion.en_UK
dc.identifier.citationH. H. S. Chang and Z. Huang, Pyroelectric effect enhancement through product property under open circuit condition, Journal of Applied Physics, 2009, Volume 106, Issue 1, Pages 0141011-0141019en_UK
dc.identifier.issn0021-8979
dc.identifier.urihttp://dx.doi.org/10.1063/1.3158472
dc.identifier.urihttp://hdl.handle.net/1826/4405
dc.language.isoenen_UK
dc.publisherAmerican Institute of Physicsen_UK
dc.rightsCopyright 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in H. H. S. Chang and Z. Huang, Pyroelectric effect enhancement through product property under open circuit condition, Journal of Applied Physics, 2009, Volume 106, Issue 1, Pages 0141011-0141019 and may be found at http://dx.doi.org/10.1063/1.3158472.
dc.titlePyroelectric effect enhancement through product property under open circuit conditionen_UK
dc.typeArticleen_UK

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