A new parafocusing paradigm for X-ray diffraction

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dc.contributor.authorProkopiou, Danae
dc.contributor.authorMcGovern, James
dc.contributor.authorDavies, Gareth
dc.contributor.authorGodber, Simon
dc.contributor.authorEvans, Paul
dc.contributor.authorDicken, Anthony
dc.contributor.authorRogers, Keith
dc.date.accessioned2020-12-09T15:13:40Z
dc.date.available2020-12-09T15:13:40Z
dc.date.issued2020-07-24
dc.description.abstractA new approach to parafocusing X-ray diffraction implemented with an annular incident beam is demonstrated for the first time. The method exploits an elliptical specimen path on a flat sample to produce relatively high intensity maxima that can be measured with a point detector. It is shown that the flat-specimen approximation tolerated by conventional Bragg–Brentano geometries is not required. A theoretical framework, simulations and experimental results for both angular- and energy-dispersive measurement modes are presented and the scattering signatures compared with data obtained with a conventional pencil-beam arrangement.en_UK
dc.identifier.citationProkopiou D, McGovern J, Davies G, et al., (2020) A new parafocusing paradigm for X-ray diffraction, Journal of Applied Crystallography, Volume 53, Issue 4, August 2020, pp.1073-1079en_UK
dc.identifier.issn0021-8898
dc.identifier.urihttps://doi.org/10.1107/S1600576720008651
dc.identifier.urihttp://dspace.lib.cranfield.ac.uk/handle/1826/16068
dc.language.isoenen_UK
dc.publisherInternational Union of Crystallographyen_UK
dc.rightsAttribution 4.0 International*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/*
dc.subjectfocal construct geometryen_UK
dc.subjectpowder X-ray diffractionen_UK
dc.subjectBragg–Brentano geometryen_UK
dc.subjectconical incident beamsen_UK
dc.titleA new parafocusing paradigm for X-ray diffractionen_UK
dc.typeArticleen_UK

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