In-plane excitation of thin silicon cantilevers using piezoelectric thin films

dc.contributor.authorLeighton, Glenn J. T.-
dc.contributor.authorKirby, Paul B.-
dc.contributor.authorFox, Colin H. J.-
dc.date.accessioned2012-02-21T23:02:47Z
dc.date.available2012-02-21T23:02:47Z
dc.date.issued2007-10-29T00:00:00Z-
dc.description.abstractThis paper deals with the actuation of in-plane and out-of-plane motions of silicon cantilevers, using a single thin film of lead zirconate titanate with a divided electrode configuration. In-plane actuation is demonstrated practically, and excellent agreement is obtained between theoretically predicted and experimentally measured resonant amplitudes, for the fundamental out-of-plane and in-plane modes of vibration of the fabricated test cantilevers.en_UK
dc.identifier.citationGlenn J. T. Leighton, Paul B. Kirby, and Colin H. J. Fox. In-plane excitation of thin silicon cantilevers using piezoelectric thin films. Applied Physics Letters, 2007, Volume 91, Issue 18, 183510.
dc.identifier.issn0003-6951-
dc.identifier.urihttp://dx.doi.org/10.1063/1.2805070-
dc.identifier.urihttp://dspace.lib.cranfield.ac.uk/handle/1826/7017
dc.publisherAmerican Institute of Physicsen_UK
dc.titleIn-plane excitation of thin silicon cantilevers using piezoelectric thin filmsen_UK
dc.typeArticle-

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