Determination of thermal wave reflection coefficient to better estimate defect depth using pulsed thermography

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dc.contributor.authorSirikham, Adisorn
dc.contributor.authorZhao, Yifan
dc.contributor.authorMehnen, Jorn
dc.date.accessioned2017-08-25T17:41:23Z
dc.date.available2017-08-25T17:41:23Z
dc.date.issued2017-08-22
dc.description.abstractThermography is a promising method for detecting subsurface defects, but accurate measurement of defect depth is still a big challenge because thermographic signals are typically corrupted by imaging noise and affected by 3D heat conduction. Existing methods based on numerical models are susceptible to signal noise and methods based on analytical models require rigorous assumptions that usually cannot be satisfied in practical applications. This paper presents a new method to improve the measurement accuracy of subsurface defect depth through determining the thermal wave reflection coefficient directly from observed data that is usually assumed to be pre-known. This target is achieved through introducing a new heat transfer model that includes multiple physical parameters to better describe the observed thermal behaviour in pulsed thermographic inspection. Numerical simulations are used to evaluate the performance of the proposed method against four selected state-of-the-art methods. Results show that the accuracy of depth measurement has been improved up to 10% when noise level is high and thermal wave reflection coefficients is low. The feasibility of the proposed method in real data is also validated through a case study on characterising flat-bottom holes in carbon fibre reinforced polymer (CFRP) laminates which has a wide application in various sectors of industry.en_UK
dc.identifier.citationSirikham A, Zhao Y, Mehnen J, Determination of thermal wave reflection coefficient to better estimate defect depth using pulsed thermography, Infrared Physics and Technology, Vol. 86, November 2017, pp. 1-10en_UK
dc.identifier.issn1350-4495
dc.identifier.urihttp://dx.doi.org/10.1016/j.infrared.2017.08.012
dc.identifier.urihttps://dspace.lib.cranfield.ac.uk/handle/1826/12387
dc.language.isoenen_UK
dc.publisherElsevieren_UK
dc.rightsAttribution 4.0 International (CC BY 4.0) You are free to: Share — copy and redistribute the material in any medium or format Adapt — remix, transform, and build upon the material for any purpose, even commercially. The licensor cannot revoke these freedoms as long as you follow the license terms. Under the following terms: Attribution — You must give appropriate credit, provide a link to the license, and indicate if changes were made. You may do so in any reasonable manner, but not in any way that suggests the licensor endorses you or your use. Information: No additional restrictions — You may not apply legal terms or technological measures that legally restrict others from doing anything the license permits.
dc.subjectNon-destructive testing (NDT)en_UK
dc.subjectLeast-squares fitting (LSF)en_UK
dc.subjectOptimisationen_UK
dc.subject3D heat conductionen_UK
dc.subjectSignal-noise-ratio (SNR)en_UK
dc.subjectcomposite defectsen_UK
dc.titleDetermination of thermal wave reflection coefficient to better estimate defect depth using pulsed thermographyen_UK
dc.typeArticleen_UK

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