Energy-dispersive X-ray diffraction mapping on a benchtop X-ray fluorescence system
| dc.contributor.author | Lane, David W. | - |
| dc.contributor.author | Nyombi, Antony | - |
| dc.contributor.author | Shackel, J. | - |
| dc.date.accessioned | 2015-01-13T04:01:38Z | |
| dc.date.available | 2015-01-13T04:01:38Z | |
| dc.date.issued | 2014-12-31T00:00:00Z | - |
| dc.description.abstract | A method for energy-dispersive X-ray diffraction mapping is presented, using a conventional low-power benchtop X-ray fluorescence spectrometer, the Seiko Instruments SEA6000VX. Hyper spectral X-ray maps with a 10µm step size were collected from polished metal surfaces, sectioned Bi, Pb and steel shot gun pellets. Candidate diffraction lines were identified by eliminating those that matched a characteristic line for an element and those predicted for escape peaks, sum peaks, and Rayleigh and Compton scattered primary X-rays. The maps showed that the crystallites in the Bi pellet were larger than those observed in the Pb and steel pellets. The application of benchtop spectrometers to energy-dispersive X-ray diffraction mapping is discussed, and the capability for lower atomic number and lower-symmetry materials is briefly explored using multi-crystalline Si and polycrystalline sucrose. | en_UK |
| dc.identifier.citation | Lane DW, Nyombi A, Shackel J. Energy-dispersive X-ray diffraction mapping on a benchtop X-ray fluorescence system. Journal of Applied Crystallography, Volume 47, Part 2, April 2014, pp. 488-494 | |
| dc.identifier.issn | 0021-8898 | - |
| dc.identifier.uri | http://dx.doi.org/10.1107/S1600576714000314 | - |
| dc.identifier.uri | http://dspace.lib.cranfield.ac.uk/handle/1826/9019 | |
| dc.publisher | Blackwell Publishing Ltd | en_UK |
| dc.rights | Attribution-NonCommercial 4.0 International | |
| dc.rights | ||
| dc.rights.uri | http://creativecommons.org/licenses/by-nc/4.0/ | |
| dc.title | Energy-dispersive X-ray diffraction mapping on a benchtop X-ray fluorescence system | en_UK |
| dc.type | Article | - |