C.V.D. annual report: November 1965 research project RU27-1 :an analogue method for the determination of potential distributions in semiconductor systems
| dc.contributor.author | Davis, J. A. | |
| dc.contributor.author | Loeb, H. W. | |
| dc.date.accessioned | 2015-08-27T15:21:59Z | |
| dc.date.available | 2015-08-27T15:21:59Z | |
| dc.date.issued | 1965-11 | |
| dc.description.abstract | A general method for the solution of the nonlinear Shockley-Poisson differential equation which governs the potential distribution in non-degenerate semiconductor systems is described which can be applied to the evaluation of depletion layer widths, carrier densities and capacitance bias relationships of p-n junction structures. The method is based upon the use of a particular type of resistance network analogue and results obtained for several one and two dimensional configurations are discussed. | en_UK |
| dc.identifier.uri | http://dspace.lib.cranfield.ac.uk/handle/1826/9356 | |
| dc.language.iso | en | en_UK |
| dc.publisher | College of Aeronautics | en_UK |
| dc.relation.ispartofseries | 85 | en_UK |
| dc.relation.ispartofseries | COA/M-85 | en_UK |
| dc.title | C.V.D. annual report: November 1965 research project RU27-1 :an analogue method for the determination of potential distributions in semiconductor systems | en_UK |
| dc.type | Report | en_UK |