Impact of Crystallisation processes on depth profile formation in sol-gel PbZr0.52Ti0.48O3 thin films
| dc.contributor.author | Aulika, I. | - |
| dc.contributor.author | Mergen, S. | - |
| dc.contributor.author | Bencan, A. | - |
| dc.contributor.author | Zhang, Qi | - |
| dc.contributor.author | Dejneka, A. | - |
| dc.contributor.author | Kosec, M. | - |
| dc.contributor.author | Kundzins, K. | - |
| dc.contributor.author | Demarchi, D. | - |
| dc.contributor.author | Civera, P. | - |
| dc.date.accessioned | 2014-04-15T04:00:52Z | |
| dc.date.available | 2014-04-15T04:00:52Z | |
| dc.date.issued | 2013-03-28T00:00:00Z | - |
| dc.description.abstract | This study revealed the influence of crystallisation processes on the homogeneity of the sol-gel PbZr0.52Ti0.48O3 thin films, allowing identification and further optimisation of thin film performance. Crystallisation processes determine the optical gradient appearance, irrespective of the chemical solvents used in this work. X-ray differaction analysis showed that a refractive index gradient was apparent in the samples which had dominant (001)/(100) orientation and significant change of lattice parameters with thickness. | en_UK |
| dc.identifier.citation | I. Aulika, S. Mergen, A. Bencan,Q. Zhang, A. Dejneka, M. Kosec. Impact of Crystallisation processes on depth profile formation in sol-gel PbZr0.52Ti0.48O3 thin films. Advances in Applied Ceramics, Volume 112, Number 1, January 2013, Pages 53-58 | |
| dc.identifier.issn | 1743-6753 | - |
| dc.identifier.uri | http://dx.doi.org/10.1179/1743676112Y.0000000019 | - |
| dc.identifier.uri | http://dspace.lib.cranfield.ac.uk/handle/1826/8385 | |
| dc.language.iso | en_UK | - |
| dc.publisher | Maney Publishing | en_UK |
| dc.title | Impact of Crystallisation processes on depth profile formation in sol-gel PbZr0.52Ti0.48O3 thin films | en_UK |
| dc.type | Article | - |