Combined shearography and speckle pattern photography for single-access multi- component surface strain measurement

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dc.contributor.authorGroves, Roger M.-
dc.contributor.authorJames, Stephen W.-
dc.contributor.authorTatam, Ralph P.-
dc.contributor.authorFu, S.-
dc.contributor.editorShen, Gongxin X.-
dc.contributor.editorCha, Soyoung S.
dc.contributor.editorChiang, F. P.
dc.contributor.editorMercer, Carolyn R.
dc.date.accessioned2012-07-23T23:01:45Z
dc.date.available2012-07-23T23:01:45Z
dc.date.issued2003-12-31T00:00:00Z-
dc.description.abstractFull surface strain measurement requires the determination of two out-of-plane and four in-plane displacement gradient components of the surface strain tensor. Shearography is a full-field speckle interferometry technique with a sensitivity predominately to the out-of-plane displacement gradient. Speckle pattern photography has the sensitivity to the in-plane displacement, and taking the derivative yields the in-plane displacement gradient. In this paper the two techniques are combined to yield a single-access multi-component surface strain measurement using shearography to measure the out-of-plane components and speckle pattern photography to measure the in-plane components. Results are presented of a multi-component surface strain measurement.en_UK
dc.identifier.citationR.M. Groves, S. Fu, S.W. James, R.P. Tatam. Combined shearography and speckle pattern photography for single-access multi- component surface strain measurement. Proceedings of the SPIE Optical Technology and Image Processing for Fluids and Solids Diagnostics. 3-6 September 2002, Beijing, China. Volume, 5058, 351. Eds. G.X. Shen, S.S. Cha, F.P. Chiang, C.R. Mercer.
dc.identifier.issn0277-786X-
dc.identifier.urihttp://dx.doi.org/10.1117/12.509780-
dc.identifier.urihttp://dspace.lib.cranfield.ac.uk/handle/1826/7412
dc.publisherInternational Society for Optical Engineering; 1999en_UK
dc.subjectShearographyen_UK
dc.subjectSpeckle Pattern Photographyen_UK
dc.subjectSurface Strain Measurementen_UK
dc.titleCombined shearography and speckle pattern photography for single-access multi- component surface strain measurementen_UK
dc.typeConference paper-

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