Wideband measurement of transistor small signal parameters by time domain spectrometry
Date
1969-04
Authors
Supervisor/s
Journal Title
Journal ISSN
Volume Title
Publisher
College of Aeronautics
Department
Type
Report
ISSN
Format
Free to read from
Citation
Abstract
Time Domain Spectrometry (TDS) Methods are outlined and their application to measurement of transistor parameters is discussed. Experimental results are presented and the advantages and limitations of TDS methods are re-assessed. Future developments are suggested.