A VCSEL based system for on-site monitoring of low level methane emission
| dc.contributor.author | Kannath, A. | - |
| dc.contributor.author | Hodgkinson, Jane | - |
| dc.contributor.author | Gillard, R. G. | - |
| dc.contributor.author | Riley, R. J. | - |
| dc.contributor.author | Tatam, Ralph P. | - |
| dc.contributor.editor | Guenter, J. K. | - |
| dc.contributor.editor | Lei, C. | - |
| dc.date.accessioned | 2014-02-01T05:01:37Z | |
| dc.date.available | 2014-02-01T05:01:37Z | |
| dc.date.issued | 2011-12-31T00:00:00Z | - |
| dc.description.abstract | Continuous monitoring of methane emissions has assumed greater significance in the recent past due to increasing focus on global warming issues. Many industries have also identified the need for ppm level methane measurement as a means of gaining carbon credits. Conventional instruments based on NDIR spectroscopy are unable to offer the high selectivity and sensitivity required for such measurements. Here we discuss the development of a robust VCSEL based system for accurate low level measurements of methane. A possible area of application is the measurement of residual methane whilst monitoring the output of flare stacks and exhaust gases from methane combustion engines. The system employs a Wavelength Modulation Spectroscopy (WMS) scheme with second harmonic detection at 1651 nm. Optimum modulation frequency and ramp rates were chosen to maintain high resolution and fast response times which are vital for the intended application. Advanced data processing techniques were used to achieve long term sensitivity of the order of 10-5 in absorbance. The system is immune to cross interference from other gases and its inherent design features makes it ideal for large scale commercial production. The instrument maintains its calibration and offers a completely automated continuous monitoring solution for remote on site deployment. | en_UK |
| dc.identifier.citation | A. Kannath, J. Hodgkinson, R. G. Gillard, R. J. Riley, R. P. Tatam, A VCSEL based system for on-site monitoring of low level methane emission, Vertical-Cavity Surface-Emitting Lasers XV, San Francisco, California, USA, 26-27 January 2011, Paper Number: 7592-0F, edited by James K. Guenter, Chun Lei, Proceedings of SPIE Vol. 7952, 79520F (c) 2011 SPIE, CCC code: 0277-786X/11/$18 | |
| dc.identifier.isbn | 978-081948489-5 | - |
| dc.identifier.uri | http://dx.doi.org/10.1117/12.874513 | - |
| dc.identifier.uri | http://dspace.lib.cranfield.ac.uk/handle/1826/8230 | |
| dc.rights | Copyright © 2011 Society of Photo-Optical Instrumentation Engineers. This paper was published in Proceedings of SPIE Vol. 7952 and is made available with permission of SPIE. One print or electronic copy may be made for personal use only. Systematic electronic or print reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. DOI: 10.1117/12.874513 | |
| dc.subject | Wavelength modulation spectroscopy | en_UK |
| dc.subject | VCSEL | en_UK |
| dc.subject | residual methane | en_UK |
| dc.subject | tuneable diode lasers | en_UK |
| dc.title | A VCSEL based system for on-site monitoring of low level methane emission | en_UK |
| dc.type | Conference paper | - |