Chapter 6: X-Ray diffraction and focal construct technology

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dc.contributor.authorRogers, Keith
dc.contributor.authorEvans, Paul
dc.date.accessioned2022-10-26T14:44:08Z
dc.date.available2022-10-26T14:44:08Z
dc.date.issued2018-11-02
dc.description.abstractThis chapter examines the background and practice of X-ray diffraction (XRD) and considers this phenomenon principally in the context of X-ray-based security screening. The focus will be upon the practical aspects of XRD as many texts already provide comprehensive descriptions of the relevant theoretical background and that of the closely associated area of crystallography. X-ray diffraction and its development from simple materials identification to dynamic imaging will be considered, followed by a similar view of aviation screening. Subsequently, a new approach to the harvesting of diffraction signatures (Focal Construct Technology) will be introduced and consequent potential applications summarised.en_UK
dc.identifier.citationRogers K, Evans P. (2018) Chapter 6: X-Ray diffraction and focal construct technology. In: X-Ray Diffraction Imaging: Technology and Applications, Boca Raton, FL: CRC Pressen_UK
dc.identifier.eisbn9780429196492
dc.identifier.urihttps://doi.org/10.1201/9780429196492
dc.identifier.urihttps://dspace.lib.cranfield.ac.uk/handle/1826/18617
dc.language.isoenen_UK
dc.publisherCRC Pressen_UK
dc.rightsAttribution-NonCommercial 4.0 International*
dc.rights.urihttp://creativecommons.org/licenses/by-nc/4.0/*
dc.titleChapter 6: X-Ray diffraction and focal construct technologyen_UK
dc.typeBook chapteren_UK

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