Polarization-sensitive transfer matrix modeling for displacement measuring interferometry

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dc.contributor.authorBridges, Angus
dc.contributor.authorYacoot, Andrew
dc.contributor.authorKissinger, Thomas
dc.contributor.authorTatam, Ralph P.
dc.date.accessioned2020-09-07T15:31:51Z
dc.date.available2020-09-07T15:31:51Z
dc.date.freetoread2021-09-02
dc.date.issued2020-09-01
dc.description.abstractThe use of polarizing optics for both beam steering and phase measurement applications in displacement measuring interferometer designs is almost universal. Interferometer designs that employ polarizing optics in this manner are particularly sensitive to the effects of unwanted optical cavities that form within the optics due to polarization leakage and back reflections from material interfaces. Modeling techniques commonly employed in the design of such interferometers are poorly suited to the analysis of multiple passes through polarizing optics. A technique, along with an accompanying software implementation, is presented here that is capable of modeling the propagation of monochromatic plane waves through an arbitrary network of linear planar optical components.en_UK
dc.identifier.citationBridges A, Yacoot A, Kissinger T, Tatam RP. (2020) Polarization-sensitive transfer matrix modelling for displacement measuring interferometry. Applied Optics, Volume 59, Issue 25, September 2020, pp. 7694-7704en_UK
dc.identifier.cris27759771
dc.identifier.issn1559-128X
dc.identifier.urihttps://doi.org/10.1364/AO.396922
dc.identifier.urihttps://dspace.lib.cranfield.ac.uk/handle/1826/15764
dc.language.isoenen_UK
dc.publisherOptical Society of Americaen_UK
dc.rightsAttribution-NonCommercial 4.0 International*
dc.rights.urihttp://creativecommons.org/licenses/by-nc/4.0/*
dc.titlePolarization-sensitive transfer matrix modeling for displacement measuring interferometryen_UK
dc.typeArticleen_UK

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