Comparison of the low and high/very high cycle fatigue behaviors in Ni microbeams under bending

dc.contributor.authorBarrios, Alejandro
dc.contributor.authorKakandar, Ebiakpo
dc.contributor.authorCastelluccio, Gustavo M.
dc.contributor.authorPierron, Olivier N.
dc.date.accessioned2021-02-25T16:53:38Z
dc.date.available2021-02-25T16:53:38Z
dc.date.issued2021-02-16
dc.description.abstractThe present work demonstrates a micromechanical technique to investigate the low cycle fatigue (LCF) behavior of Ni microbeams under fully reversed bending loadings. The technique extends the range of measured fatigue lives from the previously reported technique for high and very high cycle fatigue (HCF/VHCF) characterization in the same microbeams. The results highlight significant differences in the slope of stress and strain-life behavior and crack propagation rates that differ from an average of 10–12 m/cycle in HCF/VHCF to an average of 10–8 m/cycle in LCF. These results, in addition to postmortem fractography work, suggest that the mechanisms follow the conventional mechanisms of crack tip stress intensification in the LCF regime. This is in stark contrast to the void-controlled mechanisms that were previously identified in the HCF/VHCF regime. These results demonstrate that the transition in governing mechanisms from void-controlled to conventional mechanisms is highly influenced by the size effects present in the microbeams.en_UK
dc.identifier.citationBarrios A, Kakandar E, Castelluccio G, Pierron ON. (2021) Comparison of the low and high/very high cycle fatigue behaviors in Ni microbeams under bending. Journal of Materials Research, Volume 36, Issue 11, June 2021, pp. 2337-2348en_UK
dc.identifier.issn0884-2914
dc.identifier.urihttps://doi.org/10.1557/s43578-020-00097-y
dc.identifier.urihttps://dspace.lib.cranfield.ac.uk/handle/1826/16415
dc.language.isoenen_UK
dc.publisherSpringeren_UK
dc.rightsAttribution-NonCommercial 4.0 International*
dc.rights.urihttp://creativecommons.org/licenses/by-nc/4.0/*
dc.subjectFatigueen_UK
dc.subjectMicroelectromechanical systems (MEMS)en_UK
dc.subjectNien_UK
dc.subjectElectrodepositionen_UK
dc.subjectMicroscaleen_UK
dc.titleComparison of the low and high/very high cycle fatigue behaviors in Ni microbeams under bendingen_UK
dc.typeArticleen_UK

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