Resistance network simulation of semiconductor systems
dc.contributor.author | Loeb, H. W. | |
dc.date.accessioned | 2016-10-20T13:27:37Z | |
dc.date.available | 2016-10-20T13:27:37Z | |
dc.date.issued | 1964-09 | |
dc.description.abstract | 1. Introduction A basic problem in the design theory of semiconductor systems such as p-n junction devices relates to the determination of the spatial variation of electrostatic potential, 4, of electric field intensity, and of mobile carrier (hole, electron) concentrations, p and n ... [cont.]. | en_UK |
dc.identifier.uri | http://dspace.lib.cranfield.ac.uk/handle/1826/10799 | |
dc.language.iso | en | en_UK |
dc.publisher | College of Aeronautics | en_UK |
dc.relation.ispartofseries | CoA/M/E&C-46 | en_UK |
dc.relation.ispartofseries | 46 | en_UK |
dc.title | Resistance network simulation of semiconductor systems | en_UK |
dc.type | Report | en_UK |