Detectability evaluation of attributes anomaly for electronic components using pulsed thermography

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dc.contributor.authorLiu, Haochen
dc.contributor.authorTinsley, Lawrence
dc.contributor.authorAddepalli, Sri
dc.contributor.authorLiu, Xiaochen
dc.contributor.authorStarr, Andrew
dc.contributor.authorZhao, Yifan
dc.date.accessioned2020-10-15T14:23:23Z
dc.date.available2020-10-15T14:23:23Z
dc.date.issued2020-09-16
dc.description.abstractCounterfeit Electronic Components (CECs) pose a serious threat to all intellectual properties and bring fatal failure to the key industrial systems. This paper initiates the exploration of the prospect of CEC detection using pulsed thermography (PT) by proposing a detectability evaluation method for material and structural anomalies in CECs. Firstly, a numerical Finite Element Modelling (FEM) simulation approach of CEC detection using PT was established to predict the thermal response of electronic components under the heat excitation. Then, by experimental validation, FEM simulates multiple models with attribute deviations in mould compound conductivity, mould compound volumetric heat capacity and die size respectively considering experimental noise. Secondly, based on principal components analysis (PCA), the gradients of the 1st and 2nd principal components are extracted and identified as two promising classification features of distinguishing the deviation models. Thirdly, a supervised machine learning-based method was applied to classify the features to identify the range of detectability. By defining the 90% of classification accuracy as the detectable threshold, the detectability ranges of deviation in three attributes have been quantitively evaluated respectively. The promising results suggest that PT can act as a concise, operable and cost-efficient tool for CECs screening which has the potential to be embedded in the initial large scale screening stage for anti-counterfeit.en_UK
dc.identifier.citationLiu H, Tinsley L, Addepalli S, et al., (2020) Detectability evaluation of attributes anomaly for electronic components using pulsed thermography. Infrared Physics and Technology, Volume 111, December 2020, Article number 103513en_UK
dc.identifier.issn1350-4495
dc.identifier.urihttps://doi.org/10.1016/j.infrared.2020.103513
dc.identifier.urihttps://dspace.lib.cranfield.ac.uk/handle/1826/15890
dc.language.isoenen_UK
dc.publisherElsevieren_UK
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 International*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/*
dc.subjectCounterfeit electronic componentsen_UK
dc.subjectAttributes anomalyen_UK
dc.subjectPulsed thermographyen_UK
dc.subjectDetectability evaluationen_UK
dc.subjectMachine learningen_UK
dc.titleDetectability evaluation of attributes anomaly for electronic components using pulsed thermographyen_UK
dc.typeArticleen_UK

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