Position determination of scatter signatures – A novel sensor geometry

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dc.contributor.authorDicken, Anthony
dc.contributor.authorRogers, Keith
dc.contributor.authorEvans, Paul
dc.contributor.authorRogers, Joseph
dc.contributor.authorChan, Jer Wang
dc.contributor.authorXun, Wang
dc.date.accessioned2011-01-20T16:55:05Z
dc.date.available2011-01-20T16:55:05Z
dc.date.issued2010-09-25
dc.description.abstractA novel diffraction sensor geometry able to provide the diffraction pattern of a suspect material without prior knowledge of the samples location is introduced. The sensor geometry can also resolve diffraction patterns originating from multiple unknown materials overlapped along the primary X-ray beam path. This is achieved through tracking Bragg peak maxima that linearly propagate from the inspection volume at a series of X-ray detector positions. A series of simulations and experiments have been performed to verify this technique and provide an insight into its characteristics. Such a technique could have widespread appeal in the security industry. Areas of most relevance include the materials characterisation of volumes such as those prevalent in an airport screening environment or equally the rapid screening for illicit drugs trafficked through the postal system.en_UK
dc.identifier.citationAnthony Dicken, Keith Rogers, Paul Evans, Joseph Rogers, Jer Wang Chan, Xun Wang, Position determination of scatter signatures - A novel sensor geometry, Talanta, Vol. 83, Issue 2, 15 December 2010, p.431-435en_UK
dc.identifier.issn0039-9140
dc.identifier.urihttp://dx.doi.org/10.1016/j.talanta.2010.09.044
dc.identifier.urihttp://dspace.lib.cranfield.ac.uk/handle/1826/4752
dc.language.isoenen_UK
dc.publisherElsevieren_UK
dc.subjectX-ray diffractionen_UK
dc.subjectAngular dispersiveen_UK
dc.subjectADXRDen_UK
dc.subjectSecurity screeningen_UK
dc.subjectExplosivesen_UK
dc.subjectDrugsen_UK
dc.titlePosition determination of scatter signatures – A novel sensor geometryen_UK
dc.typeArticleen_UK

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