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| dc.contributor.author | Volk, J. | en_UK |
| dc.contributor.author | Ferencz, K. | en_UK |
| dc.contributor.author | Ramsden, Jeremy J. | en_UK |
| dc.contributor.author | Tóth, A. L. | en_UK |
| dc.contributor.author | Bársony, I. | en_UK |
| dc.date.accessioned | 2006-01-26T12:21:15Z | |
| dc.date.available | 2006-01-26T12:21:15Z | |
| dc.date.issued | 2005-06 | en_UK |
| dc.identifier.citation | J. Volk, K. Ferencz, J. J. Ramsden, A. L. Tóth, I. Bársony. In situ observation of the evolution of porous silicon interference filter characteristics. Physica Status Solidi (A), Volume 202, Issue 8, Date: June 2005, Pages: 1703-1706 | en_UK |
| dc.identifier.uri | http://hdl.handle.net/1826/977 | |
| dc.description.abstract | Porous silicon multilayer formation was observed by in situ monitoring of the reflectivity spectra in the visible range. In order to reproduce the formation process optical model simulation was carried out. For demonstration of this method a 24-layer microcavity structure was selected. Although in this low wavelengths region some absorption and scattering effects complicate the overall picture, the combined analysis throws new light upon the evolution of the porous silicon multilayer. | en_UK |
| dc.format.extent | 1982 bytes | |
| dc.format.extent | 333179 bytes | |
| dc.format.mimetype | text/plain | |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | en | en_UK |
| dc.publisher | Wiley-VCH Verlag GmbH & Co. KGaA | en_UK |
| dc.rights | This is a preprint of an article published in Physica Status Solidi (A), Volume 202, Issue 8, Date: June 2005, Pages: 1703-1706, and located at the following Wiley URL: http://www.interscience.wiley.com/. The Contributor agrees not to update the preprint or replace it with the published version of the Contribution. | |
| dc.title | In situ observation of the evolution of porous silicon interference filter characteristics. | en_UK |
| dc.type | Article | en_UK |
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