Waddie, Andrew J.; Schemmel, Peter J.; Chalk, Christine; Isern, Luis; Nicholls, John R.; Moore, Andrew J.
(Optical Society of America, 2020-10-06)
We present a normal incidence terahertz reflectivity technique to determine the optical thickness and birefringence of yttria-stabilized zirconia (YSZ) thermal barrier coatings (TBCs). Initial verification of the method ...