Impact of crystallisation processes on depth profile formation in sol-gel PbZr0·52Ti0·48O3 thin films

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dc.contributor.author Aulika, I. -
dc.contributor.author Mergen, S. -
dc.contributor.author Bencan, A. -
dc.contributor.author Zhang, Qi -
dc.contributor.author Dejneka, A. -
dc.contributor.author Kosec, M. -
dc.contributor.author Kundzins, K. -
dc.contributor.author Demarchi, D. -
dc.contributor.author Civera, P. -
dc.date.accessioned 2014-09-25T04:01:03Z
dc.date.available 2014-09-25T04:01:03Z
dc.date.issued 2013-01-31T00:00:00Z -
dc.identifier.citation I. Aulika, S. Mergen, A. Bencan,Q. Zhang, A. Dejneka, M. Kosec. Impact of crystallisation processes on depth profile formation in sol-gel PbZr0·52Ti0·48O3 thin films. Advances in Applied Ceramics, Volume 112, Issue 1 (January 2013), pp. 53-58.
dc.identifier.issn 1743-6753 -
dc.identifier.uri http://dx.doi.org/10.1179/1743676112Y.0000000019 -
dc.identifier.uri http://dspace.lib.cranfield.ac.uk/handle/1826/8701
dc.description.abstract This study revealed the influence of crystallisation processes on the homogeneity of the sol-gel PbZr0·52Ti 0·48O3 thin films, allowing identification and further optimisation of thin film performance. Crystallisation processes determine the optical gradient appearance, irrespective of the chemical solvents used in this work. X-ray diffraction analysis showed that a refractive index gradient was apparent in the samples which had dominant (001)/(100) orientation and significant change of lattice parameters with thickness. en_UK
dc.language.iso en_UK -
dc.publisher Maney Publishing en_UK
dc.title Impact of crystallisation processes on depth profile formation in sol-gel PbZr0·52Ti0·48O3 thin films en_UK
dc.type Article -


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