Citation:
I. Aulika, S. Mergen, A. Bencan,Q. Zhang, A. Dejneka, M. Kosec. Impact of crystallisation processes on depth profile formation in sol-gel PbZr0·52Ti0·48O3 thin films. Advances in Applied Ceramics, Volume 112, Issue 1 (January 2013), pp. 53-58.
Abstract:
This study revealed the influence of crystallisation processes on the homogeneity of the sol-gel PbZr0·52Ti 0·48O3 thin films, allowing identification and further optimisation of thin film performance. Crystallisation processes determine the optical gradient appearance, irrespective of the chemical solvents used in this work. X-ray diffraction analysis showed that a refractive index gradient was apparent in the samples which had dominant (001)/(100) orientation and significant change of lattice parameters with thickness.
