Citation:
R.M. Groves, S. Fu, S.W. James, R.P. Tatam. Combined shearography and speckle pattern photography for single-access multi-
component surface strain measurement. Proceedings of the SPIE Optical Technology and Image Processing for Fluids and Solids Diagnostics.
3-6 September 2002, Beijing, China. Volume, 5058, 351. Eds. G.X. Shen, S.S. Cha, F.P. Chiang, C.R. Mercer.
Abstract:
Full surface strain measurement requires the determination of two out-of-plane
and four in-plane displacement gradient components of the surface strain tensor.
Shearography is a full-field speckle interferometry technique with a sensitivity
predominately to the out-of-plane displacement gradient. Speckle pattern
photography has the sensitivity to the in-plane displacement, and taking the
derivative yields the in-plane displacement gradient. In this paper the two
techniques are combined to yield a single-access multi-component surface strain
measurement using shearography to measure the out-of-plane components and
speckle pattern photography to measure the in-plane components. Results are
presented of a multi-component surface strain measurement.
