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Please use this identifier to cite or link to this item: http://dspace.lib.cranfield.ac.uk/handle/1826/7412

Document Type: Conference paper
Title: Combined shearography and speckle pattern photography for single-access multi- component surface strain measurement
Authors: Groves, Roger M.
James, Stephen W.
Tatam, Ralph P.
Fu, S.
Issue Date: 2003
Citation: R.M. Groves, S. Fu, S.W. James, R.P. Tatam. Combined shearography and speckle pattern photography for single-access multi- component surface strain measurement. Proceedings of the SPIE Optical Technology and Image Processing for Fluids and Solids Diagnostics. 3-6 September 2002, Beijing, China. Volume, 5058, 351. Eds. G.X. Shen, S.S. Cha, F.P. Chiang, C.R. Mercer.
Abstract: Full surface strain measurement requires the determination of two out-of-plane and four in-plane displacement gradient components of the surface strain tensor. Shearography is a full-field speckle interferometry technique with a sensitivity predominately to the out-of-plane displacement gradient. Speckle pattern photography has the sensitivity to the in-plane displacement, and taking the derivative yields the in-plane displacement gradient. In this paper the two techniques are combined to yield a single-access multi-component surface strain measurement using shearography to measure the out-of-plane components and speckle pattern photography to measure the in-plane components. Results are presented of a multi-component surface strain measurement.
URI: http://dx.doi.org/10.1117/12.509780
Appears in Collections:Staff publications - School of Engineering

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