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|Document Type: ||Conference paper|
|Title: ||Combined shearography and speckle pattern photography for single-access multi-
component surface strain measurement|
|Authors: ||Groves, Roger M.|
James, Stephen W.
Tatam, Ralph P.
|Issue Date: ||2003|
|Citation: ||R.M. Groves, S. Fu, S.W. James, R.P. Tatam. Combined shearography and speckle pattern photography for single-access multi-
component surface strain measurement. Proceedings of the SPIE Optical Technology and Image Processing for Fluids and Solids Diagnostics.
3-6 September 2002, Beijing, China. Volume, 5058, 351. Eds. G.X. Shen, S.S. Cha, F.P. Chiang, C.R. Mercer.|
|Abstract: ||Full surface strain measurement requires the determination of two out-of-plane
and four in-plane displacement gradient components of the surface strain tensor.
Shearography is a full-field speckle interferometry technique with a sensitivity
predominately to the out-of-plane displacement gradient. Speckle pattern
photography has the sensitivity to the in-plane displacement, and taking the
derivative yields the in-plane displacement gradient. In this paper the two
techniques are combined to yield a single-access multi-component surface strain
measurement using shearography to measure the out-of-plane components and
speckle pattern photography to measure the in-plane components. Results are
presented of a multi-component surface strain measurement.|
|Appears in Collections:||Staff publications - School of Engineering|
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