Browsing Cranfield Conferences and Symposia by Subject "Verification"

Browsing Cranfield Conferences and Symposia by Subject "Verification"

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  • D’Amelio, V.; Tomiyama, Tetsuo (Cranfield University Press, 2009-03-31)
    Intricate failures at the system integration phase of the design are mostly generated by interactions of product modules or/and engineering domains. Modules of the product are tested independently and when their integration ...

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