dc.description.abstract |
This work describes the development of computer models for the design of a novel
three-axis silicon accelerometer with thin-film PZT piezo-electric sensing. Theoretical
and finite element methods are used to predict the resonant frequencies, resonant mode
shapes, and charge sensitivity of the accelerometers. The strengths of each analytical
method are used to allow the identification of trends in geometrical affects, and to
optimise the design with respect to specification objectives for a commercial device.
The theoretical models have been developed and refined in conjunction with practical
fabrication trials. This has allowed the material properties to be derived, specific to the
thin-film deposition method used, and incorporated onto the models. The practical
fabrication process has raised a number of unforeseen issues, and these have led to
changes from the original design. These changes have been analysed with the
theoretical models, and revised performance predictions produced. The practical
findings are consistent with the revised predictions, and achieve close to the desired
performance specification. |
en_UK |