High energy transmission annular beam X-ray diffraction

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dc.contributor.author Dicken, Anthony
dc.contributor.author Shevchuk, Alex
dc.contributor.author Rogers, Keith
dc.contributor.author Godber, Simon
dc.contributor.author Evans, Paul
dc.date.accessioned 2019-12-16T12:16:47Z
dc.date.available 2019-12-16T12:16:47Z
dc.date.issued 2015-02-02
dc.identifier.citation Dicken A, Shevchuk A, Rogers K, et al., High energy transmission annular beam X-ray diffraction. Optics Express, Volume 23, Issue 5, 2015, pp. 6304-6312 en_UK
dc.identifier.issn 1094-4087
dc.identifier.uri https://doi.org/10.1364/OE.23.006304
dc.identifier.uri http://dspace.lib.cranfield.ac.uk/handle/1826/14840
dc.description.abstract We demonstrate material phase retrieval by linearly translating extended polycrystalline samples along the symmetry axis of an annular beam of high-energy X-rays. A series of pseudo-monochromatic diffraction images are recorded from the dark region encompassed by the beam. We measure Bragg maxima from different annular gauge volumes in the form of bright spots in the X-ray diffraction intensity. We present the experiment data from three materials with different crystallographic structural properties i.e. near ideal, large grain size and preferred orientation. This technique shows great promise for analytical inspection tasks requiring highly penetrating radiation such as security screening, medicine and nondestructive testing. en_UK
dc.language.iso en en_UK
dc.publisher Optical Society of America en_UK
dc.rights Attribution 4.0 International *
dc.rights.uri http://creativecommons.org/licenses/by/4.0/ *
dc.subject Diffraction en_UK
dc.subject X-ray optics en_UK
dc.subject Scattering measurements en_UK
dc.subject X-ray imaging en_UK
dc.title High energy transmission annular beam X-ray diffraction en_UK
dc.type Article
dc.identifier.cris 4783423

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