The improvement of micro-electronic component production operations by the application of cranfield developed precision engineering techniques

Abstract

From an examination of the Cranfield Universal Measuring Machine certain features were selected. These features were linked together with some of the manufacturing and assembly operations used to make dual-in-line integrated circuits. The result was a group of design specifications for automatic machines to effect substantial improvements in productivity in those manufacturing operations. The report describes the preliminary work which culminated in the preparation of specifications, discussions with manufacturers and changes which were made as a result of these discussions. The report concludes with a number of proposals for continuing the main work and suggests certain additional, separate, investigations which, it is thought, would produce information of value to the semi-conductor industry.