Abstract:
From an examination of the Cranfield Universal Measuring Machine certain
features were selected. These features were linked together with some of the
manufacturing and assembly operations used to make dual-in-line integrated
circuits. The result was a group of design specifications for automatic
machines to effect substantial improvements in productivity in those manufacturing
operations.
The report describes the preliminary work which culminated in the
preparation of specifications, discussions with manufacturers and changes
which were made as a result of these discussions. The report concludes with
a number of proposals for continuing the main work and suggests certain
additional, separate, investigations which, it is thought, would produce
information of value to the semi-conductor industry.
