Characterisation and measurement to the sub-micron scale of a reference wire position

Sanz, Claude; Cherif, Ahmed; Mainaud-Durand, Hélène; Morantz, Paul; Shore, Paul

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dc.contributor.author	Sanz, Claude
dc.contributor.author	Cherif, Ahmed
dc.contributor.author	Mainaud-Durand, Hélène
dc.contributor.author	Morantz, Paul
dc.contributor.author	Shore, Paul
dc.date.accessioned	2017-09-22T11:20:22Z
dc.date.available	2017-09-22T11:20:22Z
dc.date.issued	2015-09-21
dc.identifier.citation	Sanz C, Cherif A, Mainaud Durand H, Morantz P, Shore P, Characterisation and measurement to the sub-micron scale of a reference wire position, Proceedings of 17th International Congress of Metrology, 21-24 September 2015, Paris, France, Article number 13005	en_UK
dc.identifier.uri	http://dx.doi.org/10.1051/metrology/20150013005
dc.identifier.uri	https://dspace.lib.cranfield.ac.uk/handle/1826/12538
dc.language.iso	en	en_UK
dc.publisher	EDP Sciences	en_UK
dc.rights	Attribution 4.0 International (CC BY 4.0) You are free to: Share — copy and redistribute the material in any medium or format Adapt — remix, transform, and build upon the material for any purpose, even commercially. The licensor cannot revoke these freedoms as long as you follow the license terms. Under the following terms: Attribution — You must give appropriate credit, provide a link to the license, and indicate if changes were made. You may do so in any reasonable manner, but not in any way that suggests the licensor endorses you or your use. Information: No additional restrictions — You may not apply legal terms or technological measures that legally restrict others from doing anything the license permits.
dc.title	Characterisation and measurement to the sub-micron scale of a reference wire position	en_UK
dc.type	Conference paper	en_UK