Energy-storage properties and electrocaloric effects of Pb(1-3x/2)LaxZr0.85Ti0.15O3 antiferroelectric thick films

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Energy-storage_properties_and_electrocaloric_effect-2014.pdf (1.04 MB)

Date

2014-06-30

Authors

Zhao, Ye
Hao, Xihong
Zhang, Qi

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American Chemical Society

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Article

ISSN

1944-8244

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http://dx.doi.org/10.1021/am502415z
 https://dspace.lib.cranfield.ac.uk/handle/1826/10873

Citation

Zhao, Y., Hao, X., Zhang, Q. (2014) Energy-storage properties and electrocaloric effects of Pb(1-3x/2)LaxZr0.85Ti0.15O3 antiferroelectric thick films, ACS Applied Materials and Interfaces, Vol. 6, Iss. 14, pp. 11633-11639

Abstract

1-µm-Pb(1-3x/2)LaxZr0.85Ti0.15O3 (PLZT) antiferroelectric (AFE) thick films with x = 0.08, 0.10, 0.12, and 0.14 were deposited on LaNiO3/Si (100) substrates by a sol-gel method. The dielectric properties, energy-storage performance, electrocaloric effect, and leakage current behavior were investigated in detail. With increasing La content, dielectric constant and saturated polarizations of the thick films were gradually decreased. A maximum recoverable energy-storage density of 38 J/cm3 and efficiency of 71% were achieved in the thick films with x = 0.12 at room temperature. Moreover, a large reversible adiabatic temperature change ∆T = 25.0 o C was presented in the thick films with x = 0.08 at 127 o C at 990 kV/cm. All the samples had a lower leakage current density below 10- 6 A/cm2 at room temperature. These results indicated that the PLZT AFE thick films could be a potential candidate for applications in high energy-storage density capacitors and cooling devices.

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Keywords

PLZT thick films, Sol-gel, Dielectric properties, Energy-storage properties, Electrocaloric effect

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