Volk, J.; Ferencz, K.; Ramsden, Jeremy J.; Tóth, A. L.; Bársony, I.
(Wiley-VCH Verlag GmbH & Co. KGaA, 2005-06)
Porous silicon multilayer formation was observed by in situ monitoring of the reflectivity spectra in the visible range. In order to reproduce the formation process optical model simulation was carried out. For demonstration ...