Barrios, Alejandro; Gupta, Saurabh; Castelluccio, Gustavo M.; Pierron, Olivier N.
(2018-02-28)
This Letter presents a quantitative in situ scanning electron microscope (SEM) nanoscale high and very high cycle fatigue (HCF/VHCF) investigation of Ni microbeams under bending, using a MEMS microresonator as an integrated ...