Du, Weixiang; Liu, Haochen; Sirikham, Adisorn; Addepalli, Sri; Zhao, Yifan
(Elsevier, 2020-12-18)
With the increase of the functionalisation, integration and complexity of industrial components and systems, deploying Non-Destructive Testing (NDT) devices for ‘in-situ’ inspection has become a major challenge for high-value ...