Sirikham, Adisorn; Zhao, Yifan; Liu, Haochen; Xu, Yigeng; Williams, Stewart; Mehnen, Jorn
(Elsevier, 2019-12-04)
Defects detected by most thermographic inspection are represented in the form of 2D image, which might limit the understanding of where the defects initiate and how they grow over time. This paper introduces a novel technique ...