Bissacco, Guiliano; Liltorp, Klaus; Nedrehagen, Ivan; Svinning, Øystein; Nielsen, Nicolaj Elias; Kruse, Christian Wissing; Shaheen, Amrozia
(Cranfield University, 2022-11-08)
Metrological characterisation is a fundamental step towards assuring the traceability of a measuring instrument; particularly challenging for non-contact optical imaging systems due to the inadequacy of a specific reference ...