Loukas, Charalampos; Vasilev, Momchil; Zimmerman, Rastislav; Vithanage, Randika K. W.; Mohseni, Ehsan; MacLeod, Charles N.; Lines, David; Pierce, Stephen Gareth; Williams, Stewart; Ding, Jialuo; Burnham, Kenneth; Sibson, Jim; O’Hare, Tom; Grosser, Michael R.
(MDPI, 2023-04-05)
The increased demand for cost-efficient manufacturing and metrology inspection solutions for complex-shaped components in High-Value Manufacturing (HVM) sectors requires increased production throughput and precision. This ...